PHDS Co.
Third-Party Testing

Spatially-Resolved HPGe Gamma-Ray Spectroscopy of Swipe Samples (PNNL, 2017)

PNNL characterized a high-rate GeGI-s for nuclear forensics, using its HPGe pixelization to generate isotope-specific spatial maps of swipe samples placed directly on the detector face.

PHDS Technical Staff · January 2017

PHDS Technical Staff
Application Engineer · January 1, 2017

This PNNL conference paper (PNNL-SA-126698), with authors including McDonald and Marianno, evaluates a high-rate variant of the GeGI, the GeGI-s, for screening swipe samples in the National Technical Nuclear Forensics mission. The GeGI-s is a modified GeGI-4 planar HPGe detector capable of several million counts per second, allowing high-activity samples to be placed directly on the detector face. Its energy resolution and pixelization let it generate isotope-specific spatial maps of material on a swipe. The study characterized the detector's spatial efficiency response by rastering a collimated beam across the face, finding it largely uniform with two correctable non-uniformities.